Assessing the quality of 3D-printed ALD films by Low Energy Ion Scattering
Thomas Grehl, IONTOF GmbH, Germany
Filtering Properties of Epitaxial Boron Nitride
Adrianna Wójcik, Łukasiewicz Research Network - Institute of Microelectronics and Photonics, Poland
Atomic depth-resolution characterization of MAX and MXenes using ultra-low energy secondary ion mass spectrometry
Paweł Piotr Michałowski, Łukasiewicz Research Network - Institute of Microelectronics and Photonics, Poland
Depth profiling of ion-implanted in 2D and 3D samples by high-energy electron scattering
Henrique Trombini, Universidade Federal de Ciências da Saúde de Porto Alegre, Brazil
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Registration deadline:
10 October 2021 [extended]
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