CEST time |
Poster number |
Title |
10:00-12:00 |
P38 |
Low energy, high energy and sequential ion irradiation effects on 3C-SiC – Ion channeling study
Sreelakshmi N, Indira Gandhi Centre for Atomic Research (IGCAR), India
|
P39 |
Ion beam induced luminescence (IBIL) analysis of europium-activated phosphate glass micro-beads scintillators at clinical carbon beam therapy field
Wataru Kada, Gunma University, Japan
|
P40 |
Measurement of X-ray production cross sections for lower-energy (0.7 – 3.5 MeV) proton induced Cu_K, Ag_L and Au_M X-rays from thick samples
L.d. Yu, Chiang Mai University, Thailand
|
P41 |
Defect induced band tuning of MeV Ni ion implanted MgO(100)
Sourav Bhakta, NISER, India
|
P42 |
Effects of Swift Heavy Ion irradiation on the structural and electrical properties of HfO₂ thin-films deposited on GaAs
Karra Vinod Kumar, University of Hyderabad, India
|
P43 |
Proton and argon ion beam induced luminescence of europium complexes in porous silica-based adsorbents
Masaumi Nakahara, Japan Atomic Energy Agency, Japan
|
P44 |
Characterization of precipitation formed in simulated high level liquid waste
Sou Watanabe, Japan Atomic Energy Agency, Japan
|
P45 |
Evaluation of remaining spent extraction solvent in vermiculite by PIXE analysis
Yoichi Arai, Japan Atomic Energy Agency, Japan
|
P46 |
Effects of Swift Heavy Ion irradiation and interfacial layer on the performance of non-stoichiometric HfOx based RRAM devices
Nimmala Arun, University of Hyderabad, India
|
P47 |
MeV-proton capillary-microbeam PIXE mapping study of solution diffusion in paper
L.d. Yu, Chiang Mai University, Thailand
|
P48 |
Irradiation of (111)-CaF₂ using a modernized beamline in Uppsala
Petter Ström, Uppsala University, Sweden
|
P49 |
Use of PIXE in sequence with Direct Analyte-Probed Nanoextraction Liquid Chromatography Mass Spectrometry to co-locate elemental and lipid biomarkers in tissue
Holly-May Lewis, University of Surrey, UK
|
P50 |
Sequential Ion Beam Analysis (IBA) and Secondary Ion Mass Spectrometry (SIMS) imaging
Catia Costa, University of Surrey, UK
|
P52 |
Multi-analytical study of XVII century leather wall coverings
Massimo Chiari, INFN Sezione di Firenze, Italy
|
P77 |
The application of ion beam analysis in the erosion properties of tungsten-based materials
Hanjun Tu, Fudan University, China
|
P78 |
Elemental analysis of aircraft engine smoke number filter samples with micro-PIXE
Saitoh Katsumi, Environmental Science Analysis & Research Laboratory & National Institute for Environmental Studies, Japan
|