MeV-SIMS/SNMS investigation of electronic sputtering under swift heavy ion irradiation of solids
Andreas Wucher, Universitaet Duisburg-Essen, Germany
18:15
18:15
4D surface reconstructions from microscale photogrammetry: correlation of 3D models with SIMS to study microstructural topography and chemical distribution
Alexander Ost, Luxembourg Institute of Science and Technology (LIST), Luxemburg
18:30
18:30
Versatile applications of a 3D transmission setup using KEV ION energies