He+ LEIS analysis combined with pulsed jet technique of gas sensing mechanism on semiconductor gas sensor surfaces
Taku Suzuki, National Institute for Materials Science, Japan
Ion Beam on beam testing of advanced functional electronic devices for space technologies
Zeljko Pastuovic, ANSTO-Centre for Accelerator Science, Australia
Role of low energy Si ions in charge density phonon mode of TiSe₂
Utkalikapriyadarsini Sahoo, NISER, India
Application of Silicon Drift Detector in PIXE-T System of Fudan University
Shimei Wang, Fudan University, China
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Registration deadline:
10 October 2021 [extended]
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