A practical guide to choosing the best Ar gas cluster ion beam for ToF SIMS measurements
Naoko Sano, Ionoptika Ltd, UK
Experimental study of crater formation under gold cluster ions
Sabrina Gouasmia Boussahoul, Ruder Boskovic Institute, Croatia
Cluster SIMS of Solid Surfaces Covered by Graphene: Data on Sputtering and Ion Emission via Single Cluster Projectile Impacts
Stanislav Verkhoturov, Texas A&M University, USA
Progress Towards the Limits of Molecular Nano-Analysis with Event-by-Event Nanoprojectile-Sims
Emile Schweikert, Texas A&M University, USA
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Registration deadline:
10 October 2021 [extended]
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