Invited Speakers

• Using micro-PIXE to resolve questions of mineral nutrition and tolerance in plants

  Paula Pongrac, Jožef Stefan Institute, Solvenia

• Laser-driven particle sources for the elemental analysis of materials

  Francesco Mirani, Politecnico Milano, Italy

• Beyond FAIRness: transforming IBA data into digital Cultural Heritage Objects

  Claire Pacheco, AGLAE, France

• Transmission Experiments with keV Ions

  Svenja Lohmann, HZDR, Germany

• Ion beam analysis with nanometer beams

  Gregor Hlawacek, HZDR, Germany

• Advanced multimodal analytical capabilities on FIB instruments using SIMS: new developments, applications and prospects

  Tom Wirtz, LIST, Luxemburg

• Investigating the Sputtering of Planetary Surfaces

  Paul Szabo, TUWein, Austria

• In-situ and in-operando profiling of light elements in energy materials using coincidence techniques

  Vairavel Mathayan, Uppsala University, Sweden

• Water Cluster Ion Beams for biomolecular analysis with SIMS

  Sadia Sheraz, RFI, UK

• Universal empirical and theoretical fits for an updated compilation of  K x-ray production cross sections by protons

  Gregory Lapicki, East Carolina University, USA

• Computer Simulation of the Evolution of 2- and 3-dimensional Surfaces

  Udo v. Toussaint, Max Plank Inst Garching, Germany

• (GAS)Cluster ion beam SIMS for biological and clinical research

  John Fletcher, University of Gothenburg, Sweden