Development of Ion Beam Analysis Techniques
(including but not limited to)
- SIMS - Secondary Ion Mass Spectrometry
- Dynamic – depth profiling
- Static – imaging
- 3-D imaging
- Using Cluster ions
- Using MeV ions
- PIXE - Particle Induced X-ray Emission
- RBS, NRA, ERD MeV SIMS, etc.
- MEIS - Medium Energy Ion Scattering - and LEIS - Low Energy Ion Scattering
- Combinations of techniques
Applications of Ion Beams Methods and Techniques
(in but not limited to)
- Cultural Heritage
- Forensics
- Biomedical
- Materials Science
- Environment
- Thin Films
- Energy Materials (eg Solar, Nuclear, Batteries)
- Electronic and photonic materials
- Quantum technology
Development of Equipment
(including but not limited to)
- Ion Sources
- Cluster sources
- Detection systems
- Data, acquisition, handling and archiving
- Analog and digital systems
Modelling and Theoretical Understanding
(including but not limited to)
- The interaction of energetic ions and clusters with surfaces
- Ion atom interactions, cross sections
- Secondary ion formation
- Interpretation of Experimental Data from Ion Beam techniques