Topics

Development of Ion Beam Analysis Techniques

(including but not limited to)

• SIMS - Secondary Ion Mass Spectrometry
  • Dynamic – depth profiling
  • Static – imaging
  • 3-D imaging
  • Using Cluster ions
  • Using MeV ions
• PIXE - Particle Induced X-ray Emission
• RBS, NRA, ERD MeV SIMS, etc.
• MEIS - Medium Energy Ion Scattering - and LEIS - Low Energy Ion Scattering
• Combinations of techniques

Applications of Ion Beams Methods and Techniques

(in but not limited to)

• Cultural Heritage
• Forensics
• Biomedical
• Materials Science
• Environment
• Thin Films
• Energy Materials (eg Solar, Nuclear, Batteries)
• Electronic and photonic materials
• Quantum technology

Development of Equipment 

(including but not limited to)

• Ion Sources
• Cluster sources
• Detection systems
• Data, acquisition, handling and archiving
• Analog and digital systems

Modelling and Theoretical Understanding

(including but not limited to)

• The interaction of energetic ions and clusters with surfaces
• Ion atom interactions, cross sections
• Secondary ion formation
• Interpretation of Experimental Data from Ion Beam techniques